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PHASE FORMATION IN CR-SI THIN-FILM INTERACTIONS = FORMATION D'UNE PHASE DANS LES INTERACTIONS DE COUCHES MINCES CR-SICOLGAN EG; TSAUR BY; MAYER JW et al.1980; APPL. PHYS. LETT.; ISSN 0003-6951; USA; DA. 1980; VOL. 37; NO 10; PP. 938-940; BIBL. 10 REF.Article

ELECTRICAL CHARACTERISTICS OF THIN NI2SI, NISI, AND NISI2 LAYERS GROWN ON SILICON = CARACTERISTIQUES ELECTRIQUES DE COUCHES MINCES NI2SI, NISI, ET NISI2 SUR DU SILICIUMCOLGAN EG; MAENPAA M; FINETTI M et al.1983; JOURNAL OF ELECTRONIC MATERIALS; ISSN 0361-5235; USA; DA. 1983; VOL. 12; NO 2; PP. 413-422; BIBL. 16 REF.Article

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